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Advanced Digital IC overview

Advanced Digital IC

Browse sections and subtopics. Article links appear where published.

Browse Advanced Digital IC topics

01 · Digital IC Design Foundations

1.1 · Abstraction from devices to systemsNo article yet
1.2 · ASIC and FPGA design flowsNo article yet
1.3 · Technology scaling and design tradeoffsNo article yet
1.4 · Power, performance and area metricsNo article yet
1.5 · Design specifications and constraintsNo article yet

02 · MOS Devices and CMOS Inverters

2.1 · MOS switching and device modelsNo article yet
2.2 · CMOS inverter transfer characteristicsNo article yet
2.3 · Noise margins and switching thresholdsNo article yet
2.4 · Parasitic capacitanceNo article yet
2.5 · Inverter delay and sizingNo article yet
2.6 · Process, voltage and temperature cornersNo article yet

03 · CMOS Logic Styles

3.1 · Static CMOS gate constructionNo article yet
3.2 · Complex gates and transistor sizingNo article yet
3.3 · Ratioed logicNo article yet
3.4 · Pass-transistor and transmission-gate logicNo article yet
3.5 · Dynamic and domino logicNo article yet
3.6 · Charge sharing and leakageNo article yet
3.7 · Logic-style tradeoffsNo article yet

04 · Delay and Interconnect

4.1 · RC delay and Elmore modelsNo article yet
4.2 · Logical effort and electrical effortNo article yet
4.3 · Buffer chains and repeater insertionNo article yet
4.4 · Wire resistance and capacitanceNo article yet
4.5 · Coupling and crosstalkNo article yet
4.6 · Interconnect-aware optimizationNo article yet

05 · Sequential Circuit Design

5.1 · Static latches and registersNo article yet
5.2 · Dynamic latches and registersNo article yet
5.3 · Pulse-triggered storageNo article yet
5.4 · Setup, hold and clock-to-Q characterizationNo article yet
5.5 · Time borrowingNo article yet
5.6 · Metastability and synchronizer designNo article yet

06 · Clocking and Static Timing Analysis

6.1 · Clock distribution and clock treesNo article yet
6.2 · Skew, jitter and uncertaintyNo article yet
6.3 · Timing paths and constraintsNo article yet
6.4 · Setup and hold timing closureNo article yet
6.5 · Generated clocksNo article yet
6.6 · False paths and multicycle pathsNo article yet
6.7 · Timing corners and variationNo article yet
6.8 · Clock-domain and reset-domain crossingsNo article yet

07 · Arithmetic and Datapath Architecture

7.1 · Fast adder architecturesNo article yet
7.2 · Carry-save arithmeticNo article yet
7.3 · Booth encoding and multiplier treesNo article yet
7.4 · Shifters and arithmetic unitsNo article yet
7.5 · Pipelining and retimingNo article yet
7.6 · Throughput versus latencyNo article yet
7.7 · Resource sharing and datapath controlNo article yet

08 · Low-Power Design

8.1 · Switching, short-circuit and leakage powerNo article yet
8.2 · Activity and capacitance reductionNo article yet
8.3 · Clock gatingNo article yet
8.4 · Power gating and isolationNo article yet
8.5 · Retention and level shiftersNo article yet
8.6 · Voltage and frequency scalingNo article yet
8.7 · Power intent and UPF conceptsNo article yet

09 · Memory Circuit Design

9.1 · SRAM cells and stabilityNo article yet
9.2 · Read and write pathsNo article yet
9.3 · Sense amplifiers and prechargeNo article yet
9.4 · DRAM cells and refreshNo article yet
9.5 · ROM and programmable arraysNo article yet
9.6 · Memory organization and peripheral circuitsNo article yet
9.7 · Memory timing and power tradeoffsNo article yet

10 · Synthesis and Physical Implementation

10.1 · RTL synthesis and technology mappingNo article yet
10.2 · Standard-cell libraries and characterizationNo article yet
10.3 · Floorplanning and power planningNo article yet
10.4 · Placement and congestionNo article yet
10.5 · Clock-tree synthesisNo article yet
10.6 · Routing and parasitic extractionNo article yet
10.7 · Design-rule and layout-versus-schematic checksNo article yet
10.8 · Timing and power signoffNo article yet

11 · Testability and Reliability

11.1 · Fault models and test coverageNo article yet
11.2 · Scan chains and scan insertionNo article yet
11.3 · ATPG and test compressionNo article yet
11.4 · Logic and memory built-in self-testNo article yet
11.5 · Equivalence checkingNo article yet
11.6 · IR drop and electromigrationNo article yet
11.7 · Variation, aging and robustnessNo article yet

12 · System Integration and Design Studies

12.1 · Controller and datapath partitioningNo article yet
12.2 · On-chip buses and arbitrationNo article yet
12.3 · Asynchronous FIFO designNo article yet
12.4 · Pipeline and memory integrationNo article yet
12.5 · Design-space explorationNo article yet
12.6 · Implementation results and debuggingNo article yet

Testability and Reliability

ATPG and test compression

No article has been published for this subtopic yet. Browse the topic index to find available articles.

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